Email: ravi.v@vit.ac.in
PhD: Vellore Institute of Technology, Chennai
Research Area: VLSI Design, VLSI Testing & Testability, Deep Learning In VLSI, FPGA based system, Semiconductor Memory Design, Biomedical Signal/Image processing, Machine Learning applications using LabVIEW, and IoT Systems
| Employee ID | 50583 | ||||
| Intercom | 1494 | ||||
| Educational details (Please mention all the degrees with latest first) | |||||
| Degree | Passed out year | Specialization | Institute/University/ College | ||
| PhD | 2019 | VLSI Design | Vellore Institute of Technology | ||
| M.Tech | 2004 | Medical Electronics | College of Engineering Guindy/Anna University | ||
| B.E./B.Tech | 1999 | ECE | Priyadarshini Engineering College | ||
| Research Details | |||||
| Areas of Specialization | Neuromorphic Computing, Resistive RAM, Deep Learning in VLSI, Virtual Instrumentation, VLSI Testing & Testability, Deep Learning In VLSI, Semiconductor Memory Design, Biomedical Signal/Image processing using LabVIEW, and IoT Systems | ||||
| ORCID ID | https://orcid.org/0000-0002-5097-6189 | ||||
| Scopus ID | https://www.scopus.com/authid/detail.uri?authorId=56825299200 | ||||
| H-index (scopus) | 8 | ||||
| Google Scholar ID | https://scholar.google.com/citations?user=-isD0yQAAAAJ&hl=en | ||||
| i10 index | 6 | ||||
| Completed Consultancy Project Details | |||||
| Completed Consultancy Project Title | Funding Agency | ||||
| Valeo EV development | Valeo, Chennai | ||||
| Book / Book Chapter Published Details | |||||
| Title | Publisher | Year | |||
| Intelligent, Automated, and Web Application-Based Cradle Monitoring System | Springer | 2021 | |||
| Variation-Tolerant In-Memory Digital Computations Using SRAM | Springer | 2020 | |||
| Defect Detection and Defect-Tolerant Design of a Multi-port SRAM | Springer | 2020 | |||
| Nondestructive Read Circuit for Memristor-Based Memories. In Nanoelectronic Materials and Devices | Springer | 2018 | |||
| A built-in self-repair architecture for random access memories | Springer | 2018 | |||
| Weak Cell Detection Techniques for Memristor-Based Memories | Springer | 2018 | |||
| Awards & Recognition Details(only national and international awards and recognitions) | |||||
| Name of the award, awarding agency, year of award | |||||
| “Best CI Event of the year 2010” by Goodrich Aerospace, Bangalore Year 2010 | |||||
